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HP93K SOC Datalog&STDF Setup


Verigy V93000 SOC Series User Training Part I Datalogging and Correlation

Agenda
Data Logging Test Numbering STDF Data Formatter

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Data Logging
Overview
DUT

V93000 Test System

Datalog Formatter

GDF (general datalog format)

EDF (event datalog format)
EDF Yes (enhanced tabular format) Yes (can be processed using 93K's histogram tool)

STDF (standard test data format)
STDF Yes (record format) Yes (can be processed using statistical tool)
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ASCII Binary

GDF Yes (tabular format) N/A

Data Logging
General Datalog Format (GDF)
GDF Overview ? GDF was the original 83000 datalog format ? GDF format is still supported for backwards compatibility, but is limited in functionality ? Default V93000 datalog format (sets the Report Formatter to ‘.default’ or ‘.default.PROD’)

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Data Logging
Event Datalog Format (EDF)
EDF Overview ? Event Driven ? Integrated Event Formatter ? Application Programming Interface (DRL-Data Retrieval Library) ? Datalog Data Available in ASCII Data format

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Data Logging
EDF Setup (1)

1. Load the testflow

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Data Logging
EDF Setup (2)

2. Set the System Flags

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Data Logging
EDF Setup (3)

3. Set the Testflow Flags

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Data Logging
EDF Setup (4)

Select “EventFormatter”

4. Activate the Event Formatter
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Data Logging
EventFormatter ui_report Datalog Menu

Note: The Report Formatter is now EventFormatter (not .default or .default.PROD).
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Data Logging
EDF Report Dialog Window

From the Report Dialog window, you can: ? Set log flags for a testsuite ? Set log flags for pin results ? Set functional test display information
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? Set flag for Test Limit display ? Collect shmoo data and waveforms

Data Logging
EDF Testsuite Flags and Datalog Flags

Sets the Testsuite Flags according to the datalog flags

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Data Logging
EDF Testsuite Flags and Datalog Flags

Testsuite flags specify the data written to the datalog stream

Datalog flags specify the data written to the datalog (filter settings)

Testflow

Datalog Stream

Event Formatter

Event Datalog
(ui_report Window, File)
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Data Logging
Logging FFV Data in the Report Dialog

If the test fails FFV, data are logged. Nothing is logged if the test passes.

Logs vector data of the first 3 failing cycles

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Data Logging
EventFormatter ui_report Log File Menu

The EDF datalog stream can be can saved from the Log File menu.
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Data Logging
FFV Datalog Data Characters

This table explains the FFV character data used in the EDF format verbose mode.
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Data Logging
EDF Execution
Click on the ‘running man’ to start execution OR Click on ‘execute’ to execute one testsuite.

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Data Logging
Example ui_report Window

Datalog

?After Test Execution, the ui_report window splits into 2 sections. ?The top section contains Event Datalog information. ?The bottom section contains Production Report information.

Production Report

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Data Logging
Parametric Test Event Datalog Example (1)
######## Started Testprogram Testflow ########################################## Test program Testflow of device /home/mike/93k_part1_420/74ACT299 started on 02/12/04 at 16:53:55 on gollum by mike Level device started on 02/12/04 at 16:53:55 Testflow started on 02/12/04 at 16:53:55 Site 1: P1 ======== Started Testsuite leakage ============================================= Executed Testfunction leakage on Site 1: FAILED Equation Set 1; Spec Set 2; Timing Set 1 Equation Set 2; Spec Set 2; Level Set 1 Startlabel: gross_func Pins used: @ Testmode: PPMU parallel measurement Functional pre-test executed -------- Low Level Measurement: FAILED ----------------------------------------Force Voltage: 0.400000 V |Max Current|: 0.000000 Settling Time: 5.000 ms Pass/Fail Limits: [-15.000000 uA, 15.000000 uA] Measured Range: [-0.369000 uA .. 127.723000 uA] Functional pre-test: PASSED
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Data Logging
Parametric Test Event Datalog Example (2)

-------- Pin Results ----------------------------------------------------------Q7 FAILED 126.347000 uA Q0 FAILED 124.412000 uA I/O7 FAILED 124.030000 uA I/O6 FAILED 125.681000 uA I/O5 FAILED 127.723000 uA I/O4 FAILED 124.711000 uA I/O3 FAILED 126.250000 uA I/O2 FAILED 124.296000 uA I/O1 FAILED 126.135000 uA I/O0 FAILED 124.783000 uA ======== Ended Testsuite leakage ===============================================

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Data Logging
Functional Test Event Datalog Example (1)

======== Started Testsuite functional_fct ====================================== Executed Testfunction functional on Site 1: FAILED Equation Set 1; Spec Set 2; Timing Set 1 Equation Set 2; Spec Set 2; Level Set 1 Global PASS/FAIL results Startlabel: funct_first -------- Functional: FAILED ----------------------------------------------------------- Pin Results ----------------------------------------------------------Q7 FAILED Q0 PASSED I/O7 PASSED I/O6 PASSED I/O5 FAILED Per pin PASS/FAIL results I/O4 PASSED I/O3 PASSED I/O2 FAILED I/O1 FAILED I/O0 FAILED

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Data Logging
Functional Test Event Datalog Example (2)
-------- Vector Results -------------------------------------------------------Vector Label: funct_first I I I I I I I I Pin List / / / / / / / / O O O O O O O O Q Q 7 6 5 4 3 2 1 0 7 0 # # # # # FAILED C0000000004 V0000000004 FAILED C0000000010 V0000000010 FAILED C0000000012 V0000000012 FAILED C0000000016 V0000000016 FAILED C0000000026 V0000000026 L . . L . . H . . L . . L . . . . . . . . . . . . . . . . . . . . . . L . . L . . H . . L . . L . . . . . . . . . . . . . . . . . . . . . . L . . H . . L . . L . . H . . . . . . . L . L . . . . . . . . . . . . L . . L . . L . . L . . L . . . . . . . . . . . . . . . . . . . . . . L . . L . . L . . H . . H . . . . . . . . . . . . . . . . . . . . . . H . . L . . L . . L . . L . . . . . . . . . . . . . . . H . H . . . . L . . L . . L . . L . . L . . . . . . . . . . . . . . . . . . . H . H H . . L . . L . . L . . L . . . L . L . . . . . . . . . . . . . . . . L . . L . . L . . L . . L . . . . . . . . . . . H . H . . . . . . . . L . . L . . L . . L . . L . .

failing pins
. . . . . . . . . . . . . . . . . . . .

Expected Data Received Data

Vector Number

Cycle Number
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Data Logging
Functional Test Event Datalog Example (3)

Pin List pass/fail status failing pins

Failing cycle receive edge

Expected Data Received Data Vector Number Cycle Number
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Data Logging
Saving the Datalog Stream in EDF
Click Log File Save & Clear Datalog Stream; enter the file name in the dialog as shown

Alternative method: Click File Save to save content of the Report window (enter a file name in the dialog that appears)

Report window

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Agenda
Data Logging Test Numbering STDF Data Formatter

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Test Numbering
What is the Test Number Generator?

? Automatically assigns numbers to every test and subtest*. ? Makes it easier to identify, track, and analyze test results.

*NOTE: A "subtest Test Number" refers to the number stored in the Event Data Log by the Test Number Generator.

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The Test Number Generator
Why is it Important?

? ? ? ?

Tests in a testflow can number in the thousands Provides ability to track specific tests, subtests, loops, etc. Prevents collisions* Unique test numbers are required for STDF

*NOTE: A collision occurs when two tests are assigned the same test number.

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The Test Number Generator
What are the Features?

? ? ? ?

Activated by SmarTest flags Selectable numbering options Repeatable results Simple user interface

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The Test Number Generator
How do you activate it?

1. 2. 3. 4. 5.

Load the testflow. Set the test_number_enable and test_number_manager Testflow flags to on. Set the log_events_enable System flag to on. Check output on pass and output on fail TestSuite flags. Execute the entire testflow to generate test numbers.

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Default Numbering Parameters
SmarTest Default Values in ()
Test Suite Test Number (0*): The first test suite number starts with one. Test Number Increment (1): Test suite and test number increment global value. Test Loop Increment (0*): Test loops are not incremented. Test Method Subset Number Offset (0*): No offset is applied, but the test method subset test number defaults to the Test Number Increment. Test Method Subset Number Increment (0*): No test method number is used. Collision Offset (1,000,000): A value of 1,000,000 will be added to the colliding number, if user selected values result in a collision. *Note: As used for default settings here, the value “0” indicates, not a numerical value of 0, but that the feature uses its default process, which is described above.
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Default Numbering Parameters
Example Default Settings

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Default Numbering Parameters
Example Default Setting STDF Output (using dlggen)

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Default Numbering Parameters
Example Default Setting STDF Output (using STDFreader)

Etc. Etc. Etc. Etc.
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User Selected Numbering Parameters
Definitions (1)
SmarTest Documentation Term
Test Suite Test Number Test Number Increment Test Loop Increment Test Method Subset Number Offset Test Method Subset Number Increment Collision Offset

SmarTest Flag or Field Name
Test Num. Term test_number_inc Test Num Incr, TestNum Inc Test Number Offset Test Number Increment test_num_col_offset

NOTE: See next slide for the location of each of these SmarTest Software Names.
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User Selected Numbering Parameters
Definitions (2)

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User Selected Numbering Parameters
Definitions (3)

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User Selected Numbering Parameters
Example 1 – Settings

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User Selected Numbering Parameters
Example 1 – STDF Output

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User Selected Numbering Parameters
Example 2 – Settings

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User Selected Numbering Parameters
Example 2 – STDF Output

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User Selected Numbering Parameters
Example 3 – Settings

NOTE: Test Num. Term = blank
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User Selected Numbering Parameters
Example 3 – STDF Output

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User Selected Numbering Parameters
Example 4 – Settings

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User Selected Numbering Parameters
Example 4 – Settings (cont’d)

NOTE: L1 = loop #1 L2 = loop #2

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User Selected Numbering Parameters
Example 4 – STDF Output

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Environmental Variables
TESTSUITE_TESTNAME_OFFSET (1 of 3)
export TESTSUITE_TESTNAME_OFFSET = 0

Test number Testsuite description
1 2 3 4 5 6 Leakage A Leakage A: Leakage low Leakage A: Leakage low Leakage B Leakage B: Leakage high Leakage B: Leakage high

Test suites Subtests

Using the default environment variable value of 0, test suites AND subtests are numbered, as shown above.
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Environmental Variables
TESTSUITE_TESTNAME_OFFSET (2 of 3)
export TESTSUITE_TESTNAME_OFFSET = -1

Test number Testsuite description
1 2 3 4 Leakage A: Leakage low Leakage A: Leakage low Leakage B: Leakage high Leakage B: Leakage high

Subtests

Using any negative number for the environment variable, ONLY the subtests will be numbered, as shown above.
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Environmental Variables
TESTSUITE_TESTNAME_OFFSET (3 of 3)
export TESTSUITE_TESTNAME_OFFSET = 200

Test number Testsuite description
200 1 Leakage A Leakage A: Leakage low Leakage A: Leakage low Leakage B Leakage B: Leakage high Leakage B: Leakage high Continuity

Offset numbers

2 201 3 4 202

Test suites Subtests

Using a positive number for the environment variable creates offset numbers for test suites (which will increment by 1) and default numbers for the subtests.
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Agenda
Data Logging Test Numbering STDF Data Formatter

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STDF Introduction
Background

STDF – Standard Test Data Format Developed in the mid 80’s Currently owned and maintained by IEEE Accepted as a standard by the Semiconductor ATE industry

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STDF Setup Steps (1)

1. 2. 3. 4.

Load the testflow. Set the system flags. Set the testflow flags. Set the testsuite flags.

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STDF Setup Steps (2)

Set the System Flags a. Turn log_events_enable on.

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STDF Setup Steps (3)

Set the Testflow Flags a. Turn test_number_enable on. b. Set test_number_inc to any number (user determined). c. Turn test_number_manager on.
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STDF Setup Steps (4)

Set the Testsuite Flags (if any particular testsuite datalog is needed) a. Click Output on pass to generate numbers for passing value. b. Click Output on fail to generate numbers for failing value. c. Click Per Pin on pass or Per Pin on fail to generate per-pin results.
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STDF Setup Steps (4)
Customize Testsuite flags for TestMethod
Check ‘Per pin on pass’ to send passing analog test results to STDF Check ‘Per pin on fail’ to send failing analog test results to STDF

TEST API formats require the ‘Per pin on pass/fail’ flags if they datalog values
? TEST(“pin”, “testname”, value) ? TEST(”pin”,”testname”, limit, value)

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STDF Execution
From a terminal window – – cd into the directory for the output datalog file (such as <device>/datalogs) Execute
/opt/hp93000/soc/formatter/bin/hp83_to_stdf

From the Testflow dialog box – – – Execute the testflow with the Execute All icon The hp83_to_stdf program generates a file named out.stdf_LotID_1 View the STDF file with dlggen OR
/opt/hp93000/soc/formatter/bin/STDFreader

View the datalog results

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STDF Datalog Output Example
Lot: Tester: strider Sites: 1 Program: Date: 03-Mar-05 Device: Station: 1 17:22:21 20

continuity:Continuity Site:1 OutputDC:Output DC Low OutputDC:Output DC High spec_func:Functional

0.2 V < -0.662551999 V < 0.8 V Failing Pins: 0 5.4 V < 5.498803139 V < 5.6 V Failing Pins: 0 4.5 ns < ns < 15 ns 4.5 ns < ns < 15 ns 4 ns 4 ns < ns < 13.5 ns < ns < 13.5 ns Site:1 Site:1 Site:1 Site:1 Site:1 Site:1 Site:1

1000020 gross_func:Functional 40 50 70 90 100 120 130 Bin: 1

-0.02 V < 0.000907000 V < 0.1 V Site:1

tpd_CP_IOx:Spec Search Passed tpd_CP_IOx:Spec Search Failed tpd_CP_Qx:Spec Search Passed tpd_CP_Qx:Spec Search Failed Site: 1 (software bin: 1)

The default ‘test_num_col_offset’ value of 1,000,000 creates a unique test number. Without it, test number 20 would have been repeated.
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Agenda
Data Logging Test Numbering STDF Data Formatter

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STDF Setup
Go to etc/opt/hp93000/soc/datalog/global.conf Make sure formatter.stdf.generateStdf=true With this setup dataformatter will automatically start when SmarTest up etc/opt/hp93000/soc/datalog/formatter.stdf.main.conf contains configuration options for STDF specific settings You can also have device specific formatter.stdf.main.conf, which have higher priority comparing to the system conf at /etc/opt/hp93000/soc/datalog/ eg. Save your device formatter.stdf.main.conf file at /home/demo/74ACT299/datalog/formatter.stdf.main.conf Note 1: every change on global.conf needs to RESTART SmarTest to take effect Note 2: Dataformatter can only be used on SmarTest rev.>=5.2.3

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Generate STDF from testflow running (manually)
? In global.conf set formatter.stdf.generateStdfFromTestflowEditor = true Then if you run testflow, by default, you will find the stdf output at $HOME/stdf/manual/

? The STDF file location is defined in global.conf by formatter.stdf.detailedFileLocation formatter.stdf.summaryFileLocation

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Generate STDF using application model file
? Set formatter.stdf.getOutputFileNameFromAppModel=true in global.conf

? Add one line at the Post Action part of wafer/lot/ level. STDF_FILE=CONST_INPUT($HOME/stdf/{PH_wafer_id} .stdf);

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Use command to generate STDF from DataStream
? cd /opt/hp93000/soc/formatter/bin/ ? dataformatter –h for help

? Dataformatter –d DataStreamFile STDF file will be generated at the current directory with the name out.stdf

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Troubleshooting If no STDF generated?
? Check flags (log_event_enable) ? Check global.conf ? Check formatter.stdf.main.conf ? Do you enable dataformatter by setting formatter.stdf.generateStdf in global.conf?

? If generate STDF by manually running testflow formatter.stdf.generateStdfFromTestflowEditor = true? ? Check the STDF file position definition.

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Troubleshooting If no STDF generated? (2)
? If generate STDF by Application Model file ? formatter.stdf.getOutputFileNameFromAppModel=true? ? Check the Appvar definition in formatter.stdf.main.conf STDF_FILE_SRC =AppVar:STDF_FILE ? Is the STDF_FILE defined after a MOVE_EVENT_STREAM() ? ? Try to monitor the size DataCollection file at /var/opt/hp93000/soc/tmp/93k.xxxxx/ ? For old rev. of Dataformatter (<1.1.5), if STDF file is bigger than 2GB, it might cause problem
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